piwik-script

Intern
    Wilhelm Conrad Röntgen Research Center for Complex Material Systems

    Field Emission Scanning Electron Microscope (Zeiss Ultra Plus)

    Specifications

    • Resolution:
      - 0.8 nm  (30 kV) [STEM mode]
      - 0.8 nm  (15 kV)
    • Magnification: 12 - 1 000 000
    • Acceleration Voltage: 0.02 kV - 30 kV
    • Probe Current:
      - Configuration 1: 4 pA – 20 nA
      - Configuration 2: 12 pA – 100 nA
    • STEM-Detector
    • EDX-Detector
    • Charge Compensator
    • Micromanipulators (Kleindiek)
    • Cryo-Preparation- and Transfer-System (Quorum)

    Contact persons

    Location

    • Chair of Organic Chemistry II

    Examples

    Correcting for AFM tip induced topography distortions in protein-DNA samples
    I. Tessmer et al.
    submitted to Ultramicroscopy (2011)

    Alkaline Earth Imidazolate Coordination Polymers by Solvent Free Melt Synthesis as Potential Host Lattices for Rare Earth Photoluminescence: [AE(Im)2(ImH)2-3], Mg, Ca, Sr, Ba, x = 1–2
    A. Zurawski, J.-C. Rybak, L. V. Meyer, P. R. Matthes, V. Stepanenko, N. Dannenbauer, F. Würthner and K. Müller-Buschbaum
    Dalton Trans. 41, 4067 (2012)

    Self-Assembly and Social Self-Sorting in mixtures of Polar and Nonpolar Oligophenyleneethynylene Derivatives
    G. Fernández et al.
    submitted to J. Am. Chem. Soc. (2012)