The Joint Analytical Laboratory (JAL) provides high-resolution material analysis for the members of the RCCM.

Currently, the equipment comprises a Dual-Beam System (FEI Helios Nanolab), a Transmission Electron Microscope (FEI Titan 80-300) and a Scanning Electron Microscope (Hitachi S-4500).

A proposal for a low-voltage scanning electron microscope for the analysis of soft matter was recently approved.