Intern
    Wilhelm Conrad Röntgen Research Center for Complex Material Systems

    High-Resolution X-Ray Diffractometer (HR-XRD)

    Bruker HR-XRD

    Applications

    • High resolution X-ray diffraction:
      • Analysis of out of plane lattice constant
      • Crystalline quality of the sample
      • Strain analysis
    • X-ray Reflectometrie:
      • Determination of film thickness
      • Surface and interface roughness
    • Gracining incidence x-ray diffraction:
      • Analysis of in plane lattice constant
      • Fast reciprocal space mapping
    • Temperature dependent measurements:
      • Analysis of structural phase transitions

    Specifications

    • Primary side:
      • X-ray source: Cu ceramic tube, output 2.2 kW; parallel beam by Göbel mirror
      • Monochromators: 2 bounce Ge (220a) beamdivergence: 0.0085°; 2 bounce Ge (004a) beamdivergence: 0.0045°; 4 bounce Ge (220s) beamdivergence: 0.0033°
      • Horizontal Goniometer:
        • Theta axis: usable angle range -4° to 170°
        • Smallest stepsize: 0.0001°
        • Chi axis: useable angle range: - 11° - 98°
        • Phi axis: unlimited
      • Sample stage:
        • x,y: - 40 – 40 mm; z: 2 mm (expandable up to 40 mm)
        • Sample weight restricted to 1 kg
    • Secondary side:
      • Scintillation counter: max. 2x106 cps
      • 0D/1D detector (Lynxeye):
        • Detector window: 3° of 2 Theta
      • Adjustable optic path: variable slit; 3 bounce Ge(022) analyser crystal
      • Various sample stages:
        • Vacuum stage 
        • Tilt stage with two degrees of freedom: ± 7°; steps:0.01°
        • Temperature stage: -100°C to 350°C at p = 10-2 to 1300 mbar
    Kontakt

    Wilhelm-Conrad-Röntgen-Forschungszentrum für komplexe Materialsysteme

    Suche Ansprechpartner

    Hubland Süd Hubland Nord